Tessent
all
Diagnosis
Apply layout-aware and cell-aware diagnosis technologies to accurately classify and identify the location of defects causing failures during manufacturing tests.
Tessent Yield Learning
Decrease time to yield, manage manufacturing excursions and recover yield caused by systematic defects. By understanding how to manage and optimize the test and data collection environment, yield learning solutions can be setup to identify systematic defects that cause low yield, saving time.
Reduce complexity with Tessent Yield Learning solutions
With complexity on the rise, Tessent Yield Learning is designing tools to reduce complexity without compromising quality or profitability. We are helping customers adapt to changing environments while also decreasing time-to-market and reducing cost.
