Increase reliability

Operate an intelligent, functional monitoring and analytics infrastructure for system-on-chip (SoC) with silicon intellectual property (IP) and software.

Accurately classify and identify the location of defects causing failures during manufacturing test with layout-aware and cell-aware diagnosis technologies.

Helps eliminate noise from diagnosis data so you can determine underlying root causes, identify systematic yield limiters and select the best devices for failure analysis.

Ensure quality, enhance safety, optimize performance and increase reliability by embedding small modules directly into your system-on-chip (SoC), allowing non-intrusive observation of what's happening in your design.

Read how a growing number of standards and regulations within the automotive ecosystem are promising to save development costs by fending off cyberattacks.