Questa One Sim FX is a high-performance simulator used in Design-For-Test (DFT) for functional fault grading to enhance defect coverage for complex ICs. Integration with market-leading Tessent TestKompress offers a powerful solution for approaching zero defects parts per million (DPPM).
The automated flow and support of Tessent's format for advanced fault models provides a unique solution for improving the reliability of high-performance and complex ICs.
Address faults that can only be activated by functional patterns to improve overall defect coverage.
Increase the fault coverage beyond the scope of structural fault models.
Functional fault grading helps in verifying the correct operation and robustness of mixed-signal circuits such as security circuitry and analog blocks.
While ATPG scan-based testing is critical for detecting low-level, structural faults, functional fault grading helps ensure that the overall functional integrity of the device is maintained and that test patterns reflect the conditions that the chip will experience in real-world usage. This combination of structural and functional fault analysis helps provide a more comprehensive and robust testing strategy.
Siemens EDA offers world-class customer support for Questa One Sim FX and all of our products.
The Verification Academy provides the skills necessary to mature an organization's functional verification process capabilities, providing a methodological bridge between high-level value propositions and the low-level details.
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