Tessent
all
SiliconInsight
Accelerate test bring-up, debug and silicon characterization of devices containing Tessent ATPG, EDT, BIST and/or IJTAG test structures within an automated interactive environment.
Tessent Yield Learning
Decrease time to yield, manage manufacturing excursions and recover yield caused by systematic defects. By understanding how to manage and optimize the test and data collection environment, yield learning solutions can be setup to identify systematic defects that cause low yield, saving time.
Reduce complexity with Tessent Yield Learning solutions
With complexity on the rise, Tessent Yield Learning is designing tools to reduce complexity without compromising quality or profitability. We are helping customers adapt to changing environments while also decreasing time-to-market and reducing cost.
Explore technologies
Learn more
White Paper
all
Improve Volume Scan Diagnosis Throughput 10X
Introducing a new technique to maximize diagnosis throughput. The dynamic partitioning technology in Tessent Diagnosis enables a 50% reduction in scan diagnosis time using only 20% of the typical memory.
