Why Tessent AnalogTest?
Testing analog circuits has traditionally been a tedious, manual process. Tessent AnalogTest enables 10x-100x reduction in silicon analog test time compared to traditional specification tests.
Reduce test cost
Analog testing requires lengthy test times on expensive mixed-signal testers. Tessent AnalogTest generates minimal-impact DFT circuitry and digital test patterns to test analog circuit block in <1 ms on digital-only testers.
Increase engineering efficiency
Tessent AnalogTest transforms analog DFT and test development into a quick, automated process. Structural and specification tests are verified in simulation before being run on ATE or in-system, reducing debug time.
Maximize analog test coverage
Specification testing of analog circuits can have lower test coverage to minimize yield loss. Digital scan-based DFT and ATPG can provide simulated test patterns that achieve higher defect coverage without increasing yield loss.
Reduce time-to-market with Tessent AnalogTest coverage
Find out how to minimize manufacturing test escapes for analog and mixed-signal circuits and improve a product's time-to-market with Tessent AnalogTest.